{"id":1294,"date":"2026-10-16T09:12:34","date_gmt":"2026-10-16T01:12:34","guid":{"rendered":"http:\/\/nowa1008.web.site808.cn\/?post_type=support&#038;p=1294"},"modified":"2026-10-16T09:15:41","modified_gmt":"2026-10-16T01:15:41","slug":"probe-tip-cleaning-methods","status":"publish","type":"support","link":"https:\/\/www.nowasemi.com\/zh\/support\/probe-tip-cleaning-methods\/","title":{"rendered":"Probe Tip Cleaning Methods"},"content":{"rendered":"<h2>Probe Tip Cleaning Methods<\/h2>\n<p>Probe tips collect oxide, metal transfer, and organic residue during testing. Cleaning method, media, force, frequency, and validation must match the probe technology and pad metallurgy.<\/p>\n<h3 class=\"mt30\">\u5173\u952e\u8003\u8651\u56e0\u7d20<\/h3>\n<ul>\n<li>\u5728\u52a0\u5de5\u524d\u786e\u8ba4\u6750\u6599\u517c\u5bb9\u6027\u3001\u8bbe\u5907\u72b6\u51b5\u548c\u9a8c\u6536\u6807\u51c6\u3002.<\/li>\n<li>\u63a7\u5236\u5173\u952e\u53c2\u6570\uff0c\u5e76\u8bb0\u5f55\u6bcf\u6279\u5408\u683c\u4ea7\u54c1\u6216\u751f\u4ea7\u6279\u6b21\u7684\u53ef\u8ffd\u6eaf\u6570\u636e\u3002.<\/li>\n<li>\u5229\u7528\u68c0\u6d4b\u548c\u6027\u80fd\u7ed3\u679c\uff0c\u533a\u5206\u6b63\u5e38\u53d8\u5316\u4e0e\u6b63\u5728\u53d1\u751f\u7684\u5de5\u827a\u95ee\u9898\u3002.<\/li>\n<\/ul>\n<h3 class=\"mt30\">\u63a8\u8350\u7684\u65b9\u6cd5<\/h3>\n<p>\u4ece\u5df2\u8bb0\u5f55\u7684\u57fa\u7840\u6570\u636e\u5f00\u59cb\uff0c\u5e76\u4e00\u6b21\u6027\u6539\u53d8\u4e00\u4e2a\u660e\u786e\u7684\u56e0\u7d20\u3002\u8fd0\u884c\u4ee3\u8868\u6027\u6837\u672c\uff0c\u4e0e\u534f\u8bae\u89c4\u8303\u8fdb\u884c\u5bf9\u6bd4\uff0c\u5e76\u9a8c\u8bc1\u6539\u8fdb\u7ed3\u679c\u662f\u5426\u5728\u4e0d\u540c\u5730\u70b9\u3001\u64cd\u4f5c\u5458\u548c\u7269\u6599\u6279\u6b21\u4e2d\u4fdd\u6301\u7a33\u5b9a\u3002\u9884\u9632\u6027\u7ef4\u62a4\u548c\u5b9a\u671f\u6821\u51c6\u5e94\u8be5\u652f\u6301\u8fd9\u4e00\u8fc7\u7a0b\uff0c\u800c\u4e0d\u662f\u5f25\u8865\u4e0d\u7a33\u5b9a\u914d\u65b9\u7684\u4e0d\u8db3\u3002.<\/p>\n<h3 class=\"mt30\">\u7ed3\u8bba<\/h3>\n<p>Probe Tip Cleaning Methods should be managed through clear specifications, controlled trials, and ongoing trend review. This approach improves repeatability, supports faster troubleshooting, and reduces the risk of hidden reliability issues in semiconductor manufacturing.<\/p>","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":false},"support_cat":[75],"class_list":["post-1294","support","type-support","status-publish","hentry","support_cat-probe-card-maintenance"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.nowasemi.com\/zh\/wp-json\/wp\/v2\/support\/1294","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nowasemi.com\/zh\/wp-json\/wp\/v2\/support"}],"about":[{"href":"https:\/\/www.nowasemi.com\/zh\/wp-json\/wp\/v2\/types\/support"}],"wp:attachment":[{"href":"https:\/\/www.nowasemi.com\/zh\/wp-json\/wp\/v2\/media?parent=1294"}],"wp:term":[{"taxonomy":"support_cat","embeddable":true,"href":"https:\/\/www.nowasemi.com\/zh\/wp-json\/wp\/v2\/support_cat?post=1294"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}