Extending Probe Card Service Life
Service life improves when touchdown force, overdrive, cleaning frequency, storage, handling, and transport are controlled. Maintenance decisions should be based on condition and performance trends.
Learn more →
Service life improves when touchdown force, overdrive, cleaning frequency, storage, handling, and transport are controlled. Maintenance decisions should be based on condition and performance trends.
Learn more →Alignment and planarity determine whether probes contact the intended pad locations with balanced force. Optical inspection, scrub-mark review, and metrology help identify bent, worn, or shifted probes.
Learn more →Probe tips collect oxide, metal transfer, and organic residue during testing. Cleaning method, media, force, frequency, and validation must match the probe technology and pad metallurgy.
Learn more →Preventive maintenance protects electrical accuracy and reduces unplanned test stops. A useful program combines inspection, cleaning, verification, usage tracking, and defined service limits.
Learn more →Copyright © 2026 Suzhou NOWA Semiconductor Co., Ltd. Todos los derechos reservados.