Support technique

Wire Bond Process Troubleshooting Guide

Effective wire-bond troubleshooting separates material, equipment, tooling, surface, and recipe causes before parameters are changed. Visual evidence, failure modes, pull and shear results, and equipment history should be reviewed together.

Learn more →

Probe Card Inspection and Maintenance Guide

Routine probe-card inspection helps prevent unstable contact resistance, false test failures, pad damage, and unexpected downtime. Maintenance should combine visual inspection, electrical trends, cleaning records, planarity checks, and touchdown history.

Learn more →

Plasma Process Setup and Qualification Checklist

A plasma process should be qualified as a complete system that includes gas chemistry, power, pressure, flow, treatment time, chamber condition, fixture design, and product loading. The target may be cleaning, activation, etching, or a combination of these effects.

Learn more →

Dicing Blade Selection and Process Setup Guide

Selecting a dicing blade requires matching the abrasive size, bond type, blade thickness, exposure, and geometry to the workpiece material, thickness, street width, and required edge quality. A qualified setup also considers spindle capability, feed rate, cut depth, mounting method, and coolant delivery.

Learn more →

Vous recherchez une pièce détachée, un équipement ou une solution technique ?

Dites-nous le modèle de votre équipement, le numéro de pièce ou votre besoin en matière de processus. Notre équipe d'ingénieurs
L"équipe vous aidera à trouver la solution idéale.

Copyright © 2026 Suzhou NOWA Semiconductor Co., Ltd. Tous droits réservés.