Probe-card cleaning frequency should be based on contact resistance, touchdown count, pad metallurgy, debris accumulation, and retest trends rather than a fixed universal interval. Cleaning too late increases false failures, while excessive cleaning can shorten probe life.
Start with the approved equipment setup and process specification, then change one factor at a time using representative samples. Record the results, confirm that the improvement is repeatable, and update the operating standard only after the acceptance criteria are met.
Provide the material, equipment model, current process settings, defect images, and inspection results when requesting technical support. This information helps the support team identify the likely cause and recommend an efficient verification plan.
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