Technical Support

Wire Bond Process Troubleshooting Guide

Effective wire-bond troubleshooting separates material, equipment, tooling, surface, and recipe causes before parameters are changed. Visual evidence, failure modes, pull and shear results, and equipment history should be reviewed together.

Learn more →

Probe Card Inspection and Maintenance Guide

Routine probe-card inspection helps prevent unstable contact resistance, false test failures, pad damage, and unexpected downtime. Maintenance should combine visual inspection, electrical trends, cleaning records, planarity checks, and touchdown history.

Learn more →

Plasma Process Setup and Qualification Checklist

A plasma process should be qualified as a complete system that includes gas chemistry, power, pressure, flow, treatment time, chamber condition, fixture design, and product loading. The target may be cleaning, activation, etching, or a combination of these effects.

Learn more →

Dicing Blade Selection and Process Setup Guide

Selecting a dicing blade requires matching the abrasive size, bond type, blade thickness, exposure, and geometry to the workpiece material, thickness, street width, and required edge quality. A qualified setup also considers spindle capability, feed rate, cut depth, mounting method, and coolant delivery.

Learn more →

Looking for a Part, Equipment or Engineering Solution?

Tell us your equipment model, part number or process requirement. Our engineering
team will help you find the right solution.

Copyright © 2026 Suzhou NOWA Semiconductor Co., Ltd. All Rights Reserved.