Probe-card cleaning frequency should be based on contact resistance, touchdown count, pad metallurgy, debris accumulation, and retest trends rather than a fixed universal interval. Cleaning too late increases false failures, while excessive cleaning can shorten probe life.
Plasma treatment improves adhesion by removing trace contamination and increasing surface energy through controlled activation. Better wetting allows adhesives, coatings, and encapsulants to spread more evenly and form stronger interfaces.
Plasma cleaning is recommended when organic residue, weak boundary layers, or poor surface wettability may affect bonding, coating, molding, or adhesion. It is commonly used before die attach, wire bonding, underfill, encapsulation, and other critical assembly steps.
Dicing blades are precision tools and should be protected from impact, bending, moisture, dust, and chemical contamination. Correct storage and handling preserve blade geometry and reduce unexpected breakage during setup.
Premature blade wear is usually caused by an unsuitable blade specification, excessive feed load, poor cooling, incorrect dressing, spindle vibration, or contamination at the flange. Wear should be evaluated together with cut quality and spindle load.
Wafer dicing chipping can be reduced by matching the blade, spindle speed, feed rate, cut depth, coolant flow, and mounting method to the wafer material and thickness. Both front-side and backside chipping should be measured because they can have different root causes.
A process window defines combinations of settings that consistently meet visual, dimensional, and mechanical requirements. Designed experiments and capability data make the window repeatable across lots and tools.
Pull and shear strength reflect bond formation, wire properties, geometry, and failure mode. Improvement requires interpreting where the sample fails, not simply increasing the measured force.
Non-stick-on-pad defects can result from contamination, oxidation, poor capillary condition, weak ultrasonic transfer, pad damage, or incorrect setup. Structured checks prevent random parameter changes.
Bond force, ultrasonic energy, time, temperature, tool condition, and material quality interact to form the bond. A robust recipe creates adequate deformation and intermetallic contact without pad damage.